ARL™ EQUINOX 1000 X-ray Diffractometer
The ARL EQUINOX 1000 X-ray Diffractometer is a powerful, compact benchtop instrument designed for high-resolution X-ray diffraction (XRD) analysis. With its revolutionary EQUINOX curved detector technology and real-time simultaneous data acquisition, this system enables faster, more accurate results for structural and phase analysis in both industrial and research settings.
Engineered for versatility and efficiency, the ARL EQUINOX 1000 meets the demands of QA/QC, dynamic studies, formulation development, and teaching environments, making it ideal for laboratories of all sizes.Whether you need a UV-Vis spectrophotometer for DNA and protein quantification or a device for assessing nucleic acid purity, the NanoDrop One offers unparalleled performance and versatility.
Key Features of ARL EQUINOX 1000 X-ray Diffractometer
1. Advanced EQUINOX Curved Detector Technology
- Captures the entire diffraction pattern simultaneously without mechanical scanning, ensuring faster analysis and higher precision.
- Provides real-time data acquisition for dynamic crystallographic studies, such as phase transitions or material modifications.
2. Compact Benchtop Design
- Space-saving, robust design suitable for mobile labs, production control, and central laboratories.
- Eliminates the need for realignment with a stationary X-ray source and fixed focal length.
3. Versatile Sample Handling
- Supports powders, thin films, bulk materials, and capillary samples with minimal preparation time.
- Offers multiple sample stages, including spinning, capillary, and temperature-controlled stages, for diverse analytical needs.
4. High Performance in Real-Time
- Performs real-time XRD measurements with simultaneous acquisition over a 110° 2θ range, enabling in situ experiments.
- Rapid acquisition times of just 5–10 seconds per pattern increase throughput and efficiency.
5. Comprehensive Analytical Software
- Includes Rietveld analysis software for phase identification, quantification, crystallinity determination, and structural refinement.
- User-friendly interface simplifies complex data interpretation.
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Applications of ARL EQUINOX 1000 X-ray Diffractometer
Phase Identification and Quantification
- Determine and quantify different phases in materials with exceptional accuracy.
Crystallinity Determination
- Measure crystalline and amorphous content for materials ranging from pharmaceuticals to minerals.
Geological Mineral Analysis
- Accurately identify and analyze mineral compositions in geological samples.
Dynamic Studies
- Study phase transitions, material modifications, and crystallographic changes under varying conditions such as temperature and pressure.
Thin Film Analysis
- Perform grazing incidence XRD (GIXRD) for phase and texture determination, and X-ray reflectometry (XRR) for film thickness and interface roughness measurements.
Industrial QA/QC
- Optimize production processes and ensure product quality in industries such as cement, polymers, and pharmaceuticals.
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Technical Specifications of ARL EQUINOX 1000
| Feature | Details |
|---|---|
| Detector Technology | EQUINOX curved detector for simultaneous data acquisition |
| Measurement Range | 0° to 110° 2θ |
| Acquisition Time | 5–10 seconds per pattern |
| Sample Types | Powders, thin films, bulk materials, capillary samples |
| Sample Stages | Spinning, capillary, temperature-controlled, GIXRD, and XRR |
| Applications | Phase identification, crystallinity determination, structural refinement |
| Power | 3 kW X-ray source |
| Dimensions | Compact benchtop design |
| Software | Rietveld analysis software |
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