ETS – Electron Beam Total Solution
IM-10 SEM
The IM-10 Scanning Electron Microscope (SEM) is an entry-level model developed by ISP Co., Ltd., designed to deliver optimal functionality with essential specifications for various imaging and analysis applications.
IM-150 SEM
IM-150 is a compact ion beam etching machine designed for precise material processing applications. It features a 150mm diameter ion source and supports ion source voltages ranging from 300 to 1000V.
IM-300S SEM
IM-300 Scanning Electron Microscope (SEM) is a high-performance imaging tool designed for advanced material analysis. With 3nm resolution at 30kV (SE Image), magnifications up to 300,000x, and versatile multi-mode detection (SE and BSE), the IM-300 delivers unmatched clarity and precision.
