X-555 XRF Analyzer
The SciAps X-555 Handheld XRF Analyzer is a premium, high-performance instrument designed for precise elemental analysis across a wide range of applications. Equipped with advanced technology, including a 55 kV X-ray tube, it delivers exceptional sensitivity and accuracy, making it an essential tool for professionals in industries such as mining, environmental analysis, and regulatory compliance.
Key Features of X-555 XRF Analyzer
1. Advanced X-ray Technology
55 kV X-ray Tube: Provides extra-low detection limits for key elements like Ag, Cd, Sn, Sb, and Ba, enhancing analytical capabilities.
Automated Beam Settings: Up to three automated beam settings optimize performance across the periodic table, from Mg to U.
2. Ergonomic and Durable Design
Lightweight Construction: Weighs just under 3 lbs. (1.35 kg) with battery, ensuring ease of use during extended field operations.
Rugged Build: Features a durable aerospace-grade aluminum frame designed to withstand rigorous field conditions.
Enhanced Heat Dissipation: Redesigned housing improves thermal management, supporting high-throughput testing.
3. User-Friendly Interface
High-Brightness Touchscreen: Equipped with a 2.7-inch color capacitive touchscreen, readable in all lighting conditions, facilitating easy data viewing and navigation.
- Rear-Facing Display: Allows for convenient viewing of results during testing.
4. Versatile Analytical Capabilities
Comprehensive Element Detection: Delivers best-in-class light element performance for ultra-low detection limits of elements like Mg, Al, Si, P, and S, while also achieving impressive precision on heavy elements such as Ag, Sn, Sb, and rare earth elements.
Application-Specific Modes: Includes specialized modes for soil analysis, mining, and regulatory compliance, enhancing versatility across different industries.
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Applications of X-555 XRF Analyzer
Phase Identification and Quantification
- Determine and quantify different phases in materials with exceptional accuracy.
Crystallinity Determination
- Measure crystalline and amorphous content for materials ranging from pharmaceuticals to minerals.
Geological Mineral Analysis
- Accurately identify and analyze mineral compositions in geological samples.
Dynamic Studies
- Study phase transitions, material modifications, and crystallographic changes under varying conditions such as temperature and pressure.
Thin Film Analysis
- Perform grazing incidence XRD (GIXRD) for phase and texture determination, and X-ray reflectometry (XRR) for film thickness and interface roughness measurements.
Industrial QA/QC
- Optimize production processes and ensure product quality in industries such as cement, polymers, and pharmaceuticals.
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Technical Specifications of ARL EQUINOX 1000
| Feature | Details |
|---|---|
| Detector Technology | EQUINOX curved detector for simultaneous data acquisition |
| Measurement Range | 0° to 110° 2θ |
| Acquisition Time | 5–10 seconds per pattern |
| Sample Types | Powders, thin films, bulk materials, capillary samples |
| Sample Stages | Spinning, capillary, temperature-controlled, GIXRD, and XRR |
| Applications | Phase identification, crystallinity determination, structural refinement |
| Power | 3 kW X-ray source |
| Dimensions | Compact benchtop design |
| Software | Rietveld analysis software |
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